PROCEEDINGS VOLUME 0563
29TH ANNUAL TECHNICAL SYMPOSIUM | 20-23 AUGUST 1985
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Editor(s): Gerald F. Marshall
IN THIS VOLUME

1 Sessions, 48 Papers, 0 Presentations
All Papers  (48)
29TH ANNUAL TECHNICAL SYMPOSIUM
20-23 August 1985
San Diego, United States
All Papers
Proc. SPIE 0563, Multilayers for x-ray optics, 0000 (6 May 1985); doi: 10.1117/12.949647
Proc. SPIE 0563, Sputter deposition system for controlled fabrication of multilayers, 0000 (6 May 1985); doi: 10.1117/12.949648
Proc. SPIE 0563, Automatic deposition of multilayer X-ray coatings with laterally graded d-spacing, 0000 (6 May 1985); doi: 10.1117/12.949649
Proc. SPIE 0563, Space qualification of multilayered optics, 0000 (6 May 1985); doi: 10.1117/12.949650
Proc. SPIE 0563, Calculated reduction of radiation damage on thin layered interference mirrors, 0000 (6 May 1985); doi: 10.1117/12.949651
Proc. SPIE 0563, Preliminary investigation of changes in x-ray multilayer optics subjected to high radiation flux, 0000 (6 May 1985); doi: 10.1117/12.949652
Proc. SPIE 0563, Thermal Stability of W/C Multilayer Films, 0000 (6 May 1985); doi: 10.1117/12.949653
Proc. SPIE 0563, Figure Tolerancing Study of an Axisymmetric X-ray Microscope, 0000 (6 May 1985); doi: 10.1117/12.949654
Proc. SPIE 0563, The Development of Single and Multilayered Wolter X-ray Microscopes, 0000 (6 May 1985); doi: 10.1117/12.949655
Proc. SPIE 0563, X-Ray microscope using multilayer optics with a laser-produced plasma source, 0000 (6 May 1985); doi: 10.1117/12.949656
Proc. SPIE 0563, Elliptical X-ray analyzer spectrograph application to a laser-produced plasma, 0000 (6 May 1985); doi: 10.1117/12.949657
Proc. SPIE 0563, Survey Of The Collective French Effort On X-Ray Multi Layered Optics, 0000 (6 May 1985); doi: 10.1117/12.949658
Proc. SPIE 0563, A Unified Geometrical Insight for the Design of Toroidal Reflectors with Multilayered Optical Coatings: Figured X-ray Optics, 0000 (6 May 1985); doi: 10.1117/12.949659
Proc. SPIE 0563, Multilayer Mirrors as X-ray Filters for Slit Scan Radiography, 0000 (6 May 1985); doi: 10.1117/12.949660
Proc. SPIE 0563, Thin Films And Gratings: Theories Used To Optimize The High Reflectivity Of Mirrors And Gratings For X-Ray Optics, 0000 (6 May 1985); doi: 10.1117/12.949661
Proc. SPIE 0563, Structural Study Of Multilayered Vanadium/Nickel Superlattices, 0000 (6 May 1985); doi: 10.1117/12.949662
Proc. SPIE 0563, Multi Layers X-Ray Polarizers, 0000 (6 May 1985); doi: 10.1117/12.949663
Proc. SPIE 0563, Computing X-Ray Reflectance of Focusing Multilayer Films, 0000 (6 May 1985); doi: 10.1117/12.949664
Proc. SPIE 0563, Disorder And Diffusion In Thin-Film Multilayers, 0000 (6 May 1985); doi: 10.1117/12.949665
Proc. SPIE 0563, Image Formation in Multilayers Optics: the Schwartzschild Objective, 0000 (6 May 1985); doi: 10.1117/12.949666
Proc. SPIE 0563, F-beam Evaporated Multilayer Soft X-ray Coatings, Analyzed With Cu-K Radiation, 0000 (6 May 1985); doi: 10.1117/12.949667
Proc. SPIE 0563, Sputter Deposited Multilayer V-UV Mirrors, 0000 (6 May 1985); doi: 10.1117/12.949668
Proc. SPIE 0563, The Characterization Of Multilayers Analyzers - Models And Measurements, 0000 (6 May 1985); doi: 10.1117/12.949669
Proc. SPIE 0563, Synchrotron Based Measurements Of The Soft X-Rayperformance Of Thin Film Multilayer Structures, 0000 (6 May 1985); doi: 10.1117/12.949670
Proc. SPIE 0563, Determination Of Thickness Errors And Boundary Roughness From The Measured Performance Of A Multilayer Coating, 0000 (6 May 1985); doi: 10.1117/12.949671
Proc. SPIE 0563, Measured X-ray Performance of Synthetic Multilayers Compared To Calculated Effects of Layer Imperfection, 0000 (6 May 1985); doi: 10.1117/12.949672
Proc. SPIE 0563, Characterization Of Multilayered Structures For Soft X-Ray Mirrors, 0000 (6 May 1985); doi: 10.1117/12.949673
Proc. SPIE 0563, Measurement Of Multilayer Mirror Reflectivity And Stimulated Emission In The XUV Spectral Region, 0000 (6 May 1985); doi: 10.1117/12.949674
Proc. SPIE 0563, Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy, 0000 (6 May 1985); doi: 10.1117/12.949675
Proc. SPIE 0563, Construction Of A Multilayered X-Ray Telescope For Solar Coronal Studies From Space, 0000 (6 May 1985); doi: 10.1117/12.949676
Proc. SPIE 0563, Aspherization And Multilayer Coating Of A RITCHEY-CHRETIEN Telescope For A = 30.4 nm, 0000 (6 May 1985); doi: 10.1117/12.949677
Proc. SPIE 0563, Design And Analysis Of Spectral Slicing X-Ray Telescope Systems, 0000 (6 May 1985); doi: 10.1117/12.949678
Proc. SPIE 0563, Formula For The Meridional Section Of The Point Spread Function Of Wolter I X-Ray Telescope And Thin-Film Multilayered Optics, 0000 (6 May 1985); doi: 10.1117/12.949679
Proc. SPIE 0563, Layered Synthetic Microstructures for Solar EUV Telescopes, 0000 (6 May 1985); doi: 10.1117/12.949680
Proc. SPIE 0563, Design And Fabrication Of Carbon-Tungsten Multilayers Using Ellipsometry, 0000 (6 May 1985); doi: 10.1117/12.949681
Proc. SPIE 0563, Multilayer, Convex Surfaces For Soft X-Ray Diffraction, 0000 (6 May 1985); doi: 10.1117/12.949682
Proc. SPIE 0563, Multilayers On Flexible Mica, 0000 (6 May 1985); doi: 10.1117/12.949683
Proc. SPIE 0563, Image Quality Of Figured Multilayered Optics, 0000 (6 May 1985); doi: 10.1117/12.949684
Proc. SPIE 0563, Physical And Chemical Characterization Of Multilayered Structures, 0000 (6 May 1985); doi: 10.1117/12.949685
Proc. SPIE 0563, Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory, 0000 (6 May 1985); doi: 10.1117/12.949686
Proc. SPIE 0563, LSM-based X-Ray Diagnostics For Magnetic Fusion Energy Applications, 0000 (6 May 1985); doi: 10.1117/12.949687
Proc. SPIE 0563, Multilayer Structures For X-Ray Laser Cavities, 0000 (6 May 1985); doi: 10.1117/12.949688
Proc. SPIE 0563, Experience With The In Situ Monitor System For The Fabrication Of X-Ray Mirrors, 0000 (6 May 1985); doi: 10.1117/12.949689
Proc. SPIE 0563, Layered Synthetic Microstructures for Long Wavelength X-Ray Spectrometry, 0000 (6 May 1985); doi: 10.1117/12.949690
Proc. SPIE 0563, Performance of a LSM Spectrogoniometer For Characteristic X-ray lines, 0000 (6 May 1985); doi: 10.1117/12.949692
Proc. SPIE 0563, Performance Of Layered Synthetic Microstructures In Monochromator Applications In The Soft X-Ray Region, 0000 (6 May 1985); doi: 10.1117/12.949693
Proc. SPIE 0563, Measurements of Surface Scattering of X-rays Using a Triple Axis X-ray Spectrometer, 0000 (6 May 1985); doi: 10.1117/12.949694
Proc. SPIE 0563, Calibration Of Surface Roughness Transducers At Angstrom Levels Using X-Ray Interferometry, 0000 (6 May 1985); doi: 10.1117/12.949695
Back to Top