6 May 1985 Elliptical X-ray analyzer spectrograph application to a laser-produced plasma
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Abstract
A preliminary experimental study was conducted on the application of an elliptical analyzer spectrograph to X-ray diagnostics of pulsed plasmas. This spectrograph was designed to record a range of 100-2000 eV X-rays on calibrated Kodak RAR-21497 film. Using point calibrations and theoretical models, the spectrograph efficiency was predicted. Basic spectrograph geometry and photographic calibrations are presented in companion papers. A 20 J, 6 ns duration Nd:glass laser pulse was focussed upon planar targets of gold, aluminum, teflon and boron carbide. Sample spectra for line and X-ray yields analysis are presented.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tina J. Tanaka, Tina J. Tanaka, Merrill A. Palmer, Merrill A. Palmer, Burton L. Henke, Burton L. Henke, } "Elliptical X-ray analyzer spectrograph application to a laser-produced plasma", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949657; https://doi.org/10.1117/12.949657
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