6 May 1985 Elliptical X-ray analyzer spectrograph application to a laser-produced plasma
Author Affiliations +
A preliminary experimental study was conducted on the application of an elliptical analyzer spectrograph to X-ray diagnostics of pulsed plasmas. This spectrograph was designed to record a range of 100-2000 eV X-rays on calibrated Kodak RAR-21497 film. Using point calibrations and theoretical models, the spectrograph efficiency was predicted. Basic spectrograph geometry and photographic calibrations are presented in companion papers. A 20 J, 6 ns duration Nd:glass laser pulse was focussed upon planar targets of gold, aluminum, teflon and boron carbide. Sample spectra for line and X-ray yields analysis are presented.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tina J. Tanaka, Tina J. Tanaka, Merrill A. Palmer, Merrill A. Palmer, Burton L. Henke, Burton L. Henke, } "Elliptical X-ray analyzer spectrograph application to a laser-produced plasma", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949657; https://doi.org/10.1117/12.949657


The new ESRF thin-film x-ray reflectometer
Proceedings of SPIE (September 16 2018)
Multilayer optics for plasma physics and synchrotron radiation
Proceedings of SPIE (September 17 1995)
Multilayer, Convex Surfaces For Soft X-Ray Diffraction
Proceedings of SPIE (May 05 1985)
High selective x-ray multilayers
Proceedings of SPIE (December 22 2003)

Back to Top