6 May 1985 Image Formation in Multilayers Optics: the Schwartzschild Objective
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The construction of efficient X-ray optics has been hampered in the past by the strong aberrations implicit in the use of grazing optics. This is in turn due to the necessity of working below the critical angle for total external reflection. For most materials this (grazing) angle fallsU.,2) in the range of a few degrees. The advent of Layered Synthetic Microstructures (LSM) has opened up new possibilities, as mirrors with high reflectivities at large incidence angles in the soft X-ray region, particularly below the Carbon edge, have been demonsated. 1:1 imaging with LSM deposited on a curved Silicon substrate has been obtained (')
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Lai, B. Lai, F. Cerrina, F. Cerrina, J. H. Underwood, J. H. Underwood, } "Image Formation in Multilayers Optics: the Schwartzschild Objective", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949666; https://doi.org/10.1117/12.949666

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