6 May 1985 Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory
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Abstract
Lossy transmission line theory is shown to be a physically meaningful technique for calculating the reflectivity of thin-film multilayer structures with complex indices of refraction. The problem is approached by treating each layer as a transmission line characterized by a given impedance. Reflections are naturally due to impedance mismatches; the impedance is shown to be simply the ratio of the electric and magnetic fields of the plane waves. Both normal and oblique incidence results match conventional calculations, but the transmission line approach requires minimal coding.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul D. Rockett, James H. Lupton, "Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949686; https://doi.org/10.1117/12.949686
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