Translator Disclaimer
14 January 1986 Picosecond Semiconductor Lasers For Characterizing High-Speed Image Shutters
Author Affiliations +
Abstract
A portable system that utilizes solid state electronic timing circuits and a pulsed semiconductor laser for characterizing the optical gate sequence of high-speed image shutters, including microchannel-plate intensifier tubes (MCPTs), and silicon-intensified target vidicons (SITVs), is described and compared to earlier methods of characterization. Gate sequences obtained using the system and streak camera data of the semiconductor laser pulse are presented, with a brief discussion of the electronic delay timing and avalanche circuits used in the system.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. S. Pagano, F. J. Janson, G. J. Yates, and S. A. Jaramillo "Picosecond Semiconductor Lasers For Characterizing High-Speed Image Shutters", Proc. SPIE 0569, High Speed Photography, Videography, and Photonics III, (14 January 1986); https://doi.org/10.1117/12.949858
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Dynamic Measurements Of A Simplified Streak Device
Proceedings of SPIE (June 06 1989)
Multi-Channel Optical Streak Cameras
Proceedings of SPIE (February 03 1988)
Remote Photonic Data Recording
Proceedings of SPIE (March 10 1987)
Fully automated streak camera with EB CCD image tube
Proceedings of SPIE (December 31 1992)

Back to Top