Itek Optical Technology In Manufacturing And Metrology

I. M. Egdall; R. K. Lee

doi:10.1117/12.950393

21 February 1986 Itek Optical Technology In Manufacturing And Metrology

I. M. Egdall, R. K. Lee

Proceedings Volume 0571, Large Optics Technology; (1986) https://doi.org/10.1117/12.950393
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

There is a wide spectrum of optical systems contemplated for use in future astronomy missions. At Itek, the systems range from the large, lightweight, deployable optics required for the large deployable reflector (LDR) to the precision of grazing incidence x-ray optics for the Advanced X-ray Astrophisical Facility (AXAF). This paper describes some of the tech-nological initiatives that Itek has developed to enhance the manufacturability and the measurement of the surface quality of the spectrum of optical assemblies to be manufactured for the astronomical telescopes.

Citation Download Citation

I. M. Egdall and R. K. Lee "Itek Optical Technology In Manufacturing And Metrology", Proc. SPIE 0571, Large Optics Technology, (21 February 1986); https://doi.org/10.1117/12.950393

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