21 February 1986 Itek Optical Technology In Manufacturing And Metrology
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Proceedings Volume 0571, Large Optics Technology; (1986); doi: 10.1117/12.950393
Event: 29th Annual Technical Symposium, 1985, San Diego, United States
Abstract
There is a wide spectrum of optical systems contemplated for use in future astronomy missions. At Itek, the systems range from the large, lightweight, deployable optics required for the large deployable reflector (LDR) to the precision of grazing incidence x-ray optics for the Advanced X-ray Astrophisical Facility (AXAF). This paper describes some of the tech-nological initiatives that Itek has developed to enhance the manufacturability and the measurement of the surface quality of the spectrum of optical assemblies to be manufactured for the astronomical telescopes.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. M. Egdall, R. K. Lee, "Itek Optical Technology In Manufacturing And Metrology", Proc. SPIE 0571, Large Optics Technology, (21 February 1986); doi: 10.1117/12.950393; https://doi.org/10.1117/12.950393
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KEYWORDS
Mirrors

Optics manufacturing

Surface finishing

Reflectors

Glasses

Metrology

Aspheric lenses

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