23 February 1985 Measurement of 1/f Noise of HgCdTe, PtSi, and InSb
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Abstract
This paper describes a preliminary investigation of l/f noise in three infrared detector materials used in the MWIR (3-5um). Noise measurements of HgCdTe, PtSi, and InSb detectors were conducted and the results are presented. The various noise sources are discussed.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. L. Vinson, A. L. Vinson, E. L. Dereniak, E. L. Dereniak, } "Measurement of 1/f Noise of HgCdTe, PtSi, and InSb", Proc. SPIE 0572, Infrared Technology XI, (23 February 1985); doi: 10.1117/12.950680; https://doi.org/10.1117/12.950680
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