11 November 1985 Extension Of The Phase/Doppler Particle Analyzer To Submicron Particle Measurements
Author Affiliations +
Abstract
The Phase/Doppler method which has proven to be successful in obtaining large particle size and velocity measurements in realistic environments has been extended to measure particles as small as 0.5 micrometer in diameter. Mie theory calculations served to determine the feasibility of obtaining adequate size resolution. Experiments were conducted using 0.54, 0.80, 0.94, 2.0, and 2.88 micrometer polystyrene latex spheres to verify the measurement capability. Although the measured distributions were relatively broad, the modes of the distributions were in good agreement with the specified size. Polydispersions with mean sizes on the order of 1 to 5 micrometers were measured and compared to measurements by other means. These results also were in good agreement.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. J. Houser, M. J. Houser, W. D. Bachalo, W. D. Bachalo, "Extension Of The Phase/Doppler Particle Analyzer To Submicron Particle Measurements", Proc. SPIE 0573, Particle Sizing and Spray Analysis, (11 November 1985); doi: 10.1117/12.978036; https://doi.org/10.1117/12.978036
PROCEEDINGS
10 PAGES


SHARE
Back to Top