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11 September 1985 Refractive Index Measurements Of Lithium Niobate Integrated Optical Substrates By Total Internal Reflection
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Proceedings Volume 0578, Integrated Optical Circuit Engineering II; (1985) https://doi.org/10.1117/12.950743
Event: 1985 Cambridge Symposium, 1985, Cambridge, United States
Abstract
The measurement of the refractive index of lithium niobate integrated optical substrates of various stoichiometries is difficult because of their thinness (≈l mm). We use a prism coupling method and calculate the refractive index from the angle at which the intensity of the light from the total internal reflection in the prism base drops. The equipment is computer controlled. In addition, the method can be used to analyze lithium niobate boules to ascertain if they are potentially useful for substrates.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. E. Peterson, S. R. Lunt, R. J. Holmes, and Y. S. Kim "Refractive Index Measurements Of Lithium Niobate Integrated Optical Substrates By Total Internal Reflection", Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); https://doi.org/10.1117/12.950743
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