11 September 1985 Waveguide Diffraction Gratings In Integrated Optics
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Proceedings Volume 0578, Integrated Optical Circuit Engineering II; (1985) https://doi.org/10.1117/12.950766
Event: 1985 Cambridge Symposium, 1985, Cambridge, United States
A discussion of the various TE-TE and TM-TM coupling coefficients derived for both normal and oblique incidence to the rulings of a corrugated waveguide diffraction grating is presented. It is shown that the substantial disparity between the TM-TM coupling coefficients can result in vastly different predictions of peak grating reflectivity. We conclude that experimental examination of the coupling coefficients is necessary before the accurate design and analysis of waveguide gratings can be achieved.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. A. Weller-Brophy, L. A. Weller-Brophy, D. G. Hall, D. G. Hall, } "Waveguide Diffraction Gratings In Integrated Optics", Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950766; https://doi.org/10.1117/12.950766

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