28 March 1986 Precision Infrared On-Line Scanning for Process Control
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Proceedings Volume 0581, Thermosense VIII: Thermal Infrared Sensing for Diagnostics and Control; (1986); doi: 10.1117/12.950884
Event: 1985 Cambridge Symposium, 1985, Cambridge, United States
Abstract
On-line non-contact temperature measurement in industrial process application have long been the domain of single point radiometers. With increasing requirements on production efficiency, process automation and on-line quality control, industrial users are rapidly realizing the need for temperature profiles as well as two-dimensional thermal monitoring of their product, in order to better control production lines. The author recognizes this trend and suggests that existing thermographic systems cannot simply be "put on-line" to meet these needs. Specific on-line IR technology and know-how has to be utilized and specific testing methods be defined for determining the capabilities of a particular thermographic system for continuous monitoring and control. Fortunately, appropriate testing methodologies do already exist and can easily be implemented by the potential user himself. Experiences gained with a newly introduced thermographic line-scanner is used to illustrate typical measurement problems encountered in the heavy process industries and how these are solved using appropriate application-dedicated hardware and software.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dag Holmsten, "Precision Infrared On-Line Scanning for Process Control", Proc. SPIE 0581, Thermosense VIII: Thermal Infrared Sensing for Diagnostics and Control, (28 March 1986); doi: 10.1117/12.950884; http://dx.doi.org/10.1117/12.950884
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KEYWORDS
Thermography

Infrared imaging

Infrared radiation

Imaging systems

Temperature metrology

Scanners

Sensors

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