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1 May 1986 Accuracy Of A Heterodyne Interferometric MTF Measuring Device In The Infrared
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Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951975
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
A heterodyne interferometer was developped to be used in the visible and in the infrared. If the RMS wavefront error is used to determine a datum focal plane, MTF measurements differ by less than 3% from calculated values for two special test lenses. The interferometers are compared to other MTF measuring techniques.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roman Boutellier "Accuracy Of A Heterodyne Interferometric MTF Measuring Device In The Infrared", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.951975
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