Infrared thermovision technique is used in investigating thermal fields on microelectronic circuits. The recorded thermograms indicate both the chip-thermal distribution and chip faults if any. The results are in agreement with the simulated circuit model used.
Ashraf H. Yahia,
Nashwa M. Shaalan,
"Infrared Thermal Mapping Of Microelectronic Circuits", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951990; https://doi.org/10.1117/12.951990