1 May 1986 Infrared Thermal Mapping Of Microelectronic Circuits
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Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951990
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Infrared thermovision technique is used in investigating thermal fields on microelectronic circuits. The recorded thermograms indicate both the chip-thermal distribution and chip faults if any. The results are in agreement with the simulated circuit model used.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashraf H. Yahia, Ashraf H. Yahia, Nashwa M. Shaalan, Nashwa M. Shaalan, } "Infrared Thermal Mapping Of Microelectronic Circuits", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951990; https://doi.org/10.1117/12.951990
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