1 May 1986 Infrared Thermal Mapping Of Microelectronic Circuits
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Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.951990
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Infrared thermovision technique is used in investigating thermal fields on microelectronic circuits. The recorded thermograms indicate both the chip-thermal distribution and chip faults if any. The results are in agreement with the simulated circuit model used.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashraf H. Yahia, Nashwa M. Shaalan, "Infrared Thermal Mapping Of Microelectronic Circuits", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951990; https://doi.org/10.1117/12.951990
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