21 April 1986 Real Time Detection of Spot-Type Defects
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Proceedings Volume 0596, Architectures and Algorithms for Digital Image Processing III; (1986) https://doi.org/10.1117/12.952304
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
A detector for low-contrast blemishes on objects with high foreground-background contrast is described. An edge detector is followed by logical shifting and expansion operations in order to locate occurrences of spatial proximity of the edge orientations and polarities expected. Maximum and minimum sizes of defect detected are adjustable.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. J. Dennis, T. J. Dennis, L. J. Clark, L. J. Clark, } "Real Time Detection of Spot-Type Defects", Proc. SPIE 0596, Architectures and Algorithms for Digital Image Processing III, (21 April 1986); doi: 10.1117/12.952304; https://doi.org/10.1117/12.952304


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