14 July 1986 Correspondence Between AXAF TMA X-Ray Performance And Models Based Upon Mechanical And Visible Light Measurements
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Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966557
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The AXAF Technology Mirror Assembly (TMA) was characterized prior to x-ray testing by properties measured mechanically or with visible light; these include alignment offsets, roundness and global axial slope errors, axial figure errors with characteristic lengths greater than about five mm, and surface roughness with scale lengths between about 0.005 and 0.5 mm. The x-ray data of Schwartz et al (1985) are compared with predictions based upon the mechanical and visible light measurements.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Van Speybroeck, L. Van Speybroeck, P. J. McKinnon, P. J. McKinnon, S. S. Murray, S. S. Murray, F. A. Primini, F. A. Primini, D. A. Schwartz, D. A. Schwartz, M. V. Zombeck, M. V. Zombeck, C. C. Dailey, C. C. Dailey, J. C. Reily, J. C. Reily, M. C. Weisskopf, M. C. Weisskopf, C. L. Wyman, C. L. Wyman, } "Correspondence Between AXAF TMA X-Ray Performance And Models Based Upon Mechanical And Visible Light Measurements", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966557; https://doi.org/10.1117/12.966557
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