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14 July 1986 Derivation Of Requirements For Surface Quality And Metrology Instrumentation For AXAF/TMA
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Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966561
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The top level goal for residual image degradation due to all mirror surface errors for the Advanced X-ray Astrophysical Facility (AXAF) Technology Mirror Assembly (TMA) was a Root Mean Square (RMS) image diameter of 0.38 arc second, approximately one order of magnitude tighter than for the highly successful HEAO-B, which represented the previous state of the art. In this paper, we cover the subdivision of the top level goal into a detailed error budget for various surface errors, and from there the subdivision into requirements on the surface metrology instrumentation. The derivation of the detailed error budget for surface errors required the definition of a new set of mathematical functions to describe surface errors on cylindrical optics, and a new type of analysis of the effect of mid-frequency surface errors on high quality X-ray images. The derivation of requirements on the surface metrology instrumentation pointed the way for the conceptualizing and design of several new metrology instruments which were beyond the previous state of the art.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul Glenn and Albert Slomba "Derivation Of Requirements For Surface Quality And Metrology Instrumentation For AXAF/TMA", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966561
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