14 July 1986 Measurements Of Surface Scattering From Mirrored Surfaces Using A Triple Axis X-Ray Spectrometer
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Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966569
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
A triple axis X-ray spectrometer has been used to test the smoothness of mirrored surfaces. A perfect channel-cut Si or Ge crystal extracts Fe-ka radiation from a conventional X-ray tube. The radiation is incident on the test surface and the specularly reflected and scattered radiation from the surface is analyzed by another perfect channel-cut Si or Ge crystal. The channel-cut crystals provide an essentially "tailless" probe of the scattered radiation. The test surfaces in this study include three standard flats from the EXOSAT program, the AXAF-program and the ROSAT program, respectively, and test foils made in connection with the construction of a high throughput thin foil reflector telescope for the ESA X-ray Spectroscopy Mission XMM.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Finn E. Christensen, Finn E. Christensen, K. P. Singh, K. P. Singh, H. W. Schnopper, H. W. Schnopper, } "Measurements Of Surface Scattering From Mirrored Surfaces Using A Triple Axis X-Ray Spectrometer", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); doi: 10.1117/12.966569; https://doi.org/10.1117/12.966569
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