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14 July 1986 The Bragg Crystal Spectrometer for AXAF
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Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966588
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
MIT's High Resolution X-ray Spectroscopy investigation on AXkF involves two complementary dispersive instruments, a Bragg Crystal Spectrometer (BCS) and a High Energy Transmission Grating Spectrometer (HETGS). The overall goal of the investigation is to study the physical condtions in celestial sources by means of detailed measurements of their X-ray spectra. High spectral resolution measurements can be used to perform diagnostics of emitting and absorbing matter, leading to knowledge of temperature, ionization state, elemental abundance, density and optical depth.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. R. Canizares, T. H. Markert, and G . W. Clark "The Bragg Crystal Spectrometer for AXAF", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966588
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