21 April 1986 Characterization and Measurement of System Stability
Author Affiliations +
Proceedings Volume 0598, Instrumentation for Submillimeter Spectroscopy; (1986) https://doi.org/10.1117/12.952341
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
For the characterization of noise and stability of any measuring instrument a new and very practical method is introduced. It follows the principles of the "Allan variance" well estabilished for the characterization of the stability of frequency standards. The plot of the Allen variance versus integration time enables one to determine the different types of noise power spectra from the output of any instrument. In particular, the best range of the integration time for optimum use of the system can accurately be evaluated. Theoretical considerations and experimental results with components of the 3-m radiotelescope of Univ. of Cologne are presented.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Schieder, R. Schieder, G. Rau, G. Rau, B. Vowinkel, B. Vowinkel, "Characterization and Measurement of System Stability", Proc. SPIE 0598, Instrumentation for Submillimeter Spectroscopy, (21 April 1986); doi: 10.1117/12.952341; https://doi.org/10.1117/12.952341
PROCEEDINGS
4 PAGES


SHARE
Back to Top