16 July 1986 Application Of Holographic Contouring To Materials Testing
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Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952358
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Two-wavelength holographic contouring for fringe intervals between 5 and 20 microns is studied in detail. Particular attention is given to the fringe visibility and to the position of the reference plane. Dimensional limitations are considered. Measurement of the bending of a glass plate due to shrinkage of the epoxy coating is presented.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Denis E. Cuche, Denis E. Cuche, } "Application Of Holographic Contouring To Materials Testing", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952358; https://doi.org/10.1117/12.952358
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