16 July 1986 Automatic Fringe Analysis In Double Exposure And Live Fringe Holographic Interferometry
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Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952365
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
In general the automatic analysis of double exposure and live fringe holographic interferograms requires different and complementary approaches to the development of digital image processing software. In the former case, intensity pattern analysis must be performed, whereas in the latter, phase modulation techniques are applicable. Examples of both types of analysis will be presented, in the context of developing holographic measurement systems for use in the determination of surface deformation and strain fields in engineering components.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. W. Robinson, D. W. Robinson, D. C. Williams, D. C. Williams, } "Automatic Fringe Analysis In Double Exposure And Live Fringe Holographic Interferometry", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952365; https://doi.org/10.1117/12.952365


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