Contouring by Electronic speckle Pattern Interferometry (ESPI)

B. D. Bergquist; P. Montgomery

doi:10.1117/12.952374

16 July 1986 Contouring by Electronic speckle Pattern Interferometry (ESPI)

B. D. Bergquist, P. Montgomery

Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952374
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

A method of optically contouring object surfaces for inspection purposes, based on electronic speckle pattern interferometry is described. The technique forms a "bolt-on" addition to existing ESPI systems. It is shown that the correlation fringe contours thus obtained are equivalent to those of projected, two-beam interference fringe contours. Attractive features are the possibility of identifying a stationary reference contour, economy of light usage, and the possibility of programmable control of sensitivity.

Citation Download Citation

B. D. Bergquist and P. Montgomery "Contouring by Electronic speckle Pattern Interferometry (ESPI)", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952374

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