Information- And Image-Processing Of Scanning-Tunneling-Microscope Data

E. Stoll

doi:10.1117/12.952414

16 July 1986 Information- And Image-Processing Of Scanning-Tunneling-Microscope Data

E. Stoll

Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952414
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

Scanning Tunneling Microscopy (STM) gives information on the topography, chemical composition and electronic structure of metal and semiconductor surfaces down to the atomic scale. The experimental data can be filtered using a Wiener-type or least-square filter to eliminate blurring, to suppress noise, and, in addition, to correct spatial distortions by correlating typical picture elements. The three-dimensional profile of the processed surface picture can then be represented according to techniques developed by map-makers.

Citation Download Citation

E. Stoll "Information- And Image-Processing Of Scanning-Tunneling-Microscope Data", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952414

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