Critical Review Of Recent Developments In Electronic Speckle Pattern Interferometry

J. R. Tyrer

doi:10.1117/12.966617

1 January 1986 Critical Review Of Recent Developments In Electronic Speckle Pattern Interferometry

J. R. Tyrer

Proceedings Volume 0604, Holographic Nondestructive Testing; (1986) https://doi.org/10.1117/12.966617
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States

Abstract

Electronic Speckle Pattern Interferometry (ESPI) is now fifteen years old. What has held it back in its development? Some recent developments enabling ESPI to become a commercial instrument capable of solving specific industrial tasks will be discussed. The use of this instrument to assist both the opto-mechanical engineer and the experimental engineer to help solve problems raised at product design level as well as later when "fire fighting" pre-production and in- situ crisis that require very short investigative response times.

Citation Download Citation

J. R. Tyrer "Critical Review Of Recent Developments In Electronic Speckle Pattern Interferometry", Proc. SPIE 0604, Holographic Nondestructive Testing, (1 January 1986); https://doi.org/10.1117/12.966617

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