1 January 1986 Quantitative Holographic Analysis Of Small Components
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Proceedings Volume 0604, Holographic Nondestructive Testing; (1986) https://doi.org/10.1117/12.966615
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States
Abstract
Methods of hologram interferometry are used to study load-deflection characteristics of small components. More specifically, fundamentals of the methods of double-exposure hologram interferometry, time average hologram interferometry, and heterodyne hologram interometry are discussed, procedures for quantitative interpretation of holograms are outlined, and their applications are illustrated by representative examples. Results presented in this paper indicate viability of the methods of hologram interferometry for quantitative studies of small components.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryszard J. Pryputniewicz, Ryszard J. Pryputniewicz, } "Quantitative Holographic Analysis Of Small Components", Proc. SPIE 0604, Holographic Nondestructive Testing, (1 January 1986); doi: 10.1117/12.966615; https://doi.org/10.1117/12.966615
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