Invited Paper Radiation-Hardened Optoelectronic Components: Detectors

James J. Wiczer

doi:10.1117/12.961061

15 May 1986 Invited Paper Radiation-Hardened Optoelectronic Components: Detectors

James J. Wiczer

Proceedings Volume 0616, Optical Technologies for Communication Satellite Applications; (1986) https://doi.org/10.1117/12.961061
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States

Abstract

In this talk, we will survey recent research in the area of radiation hardened optical detectors. We have studied conventional silicon photodiode structures, special radiation hardened silicon photodiodes, and special double heterojunction AlGaAs/GaAs photodiodes in neutron, gamma, pulsed x-ray and charged particle environments. We will present results of our work and summarize other research in this area. Our studies have shown at detectors can be made to function acceptably after exposures to neutron fluences of 10¹⁵ n/cm², total dose gamma exposures of 10⁸ rad (Si), and flash x-ray environments of 10⁸ rad/sec (Si). We will describe detector structures that can operate through these conditions, pre-rad and post-rad operational characteristics, and experimental conditions that produced these results.

Citation Download Citation

James J. Wiczer "Invited Paper Radiation-Hardened Optoelectronic Components: Detectors", Proc. SPIE 0616, Optical Technologies for Communication Satellite Applications, (15 May 1986); https://doi.org/10.1117/12.961061

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