15 May 1986 Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers
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Abstract
This paper reviews the procedures we developed to select lasers for deployment in high reliability systems. The problem of screening out short-lived lasers with the aging controlled by low thermal activation energy failure mechanisms is analyzed. The rationale for and development of a purge (a set of laser-specific over-stresses) is described. Reliability results using real time device hours and more than 2 years of field use show that these selection procedures work well.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. L. Hartman, F. R. Nash, P. J. Anthony, "Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers", Proc. SPIE 0616, Optical Technologies for Communication Satellite Applications, (15 May 1986); doi: 10.1117/12.961062; https://doi.org/10.1117/12.961062
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