15 May 1986 Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers
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Abstract
This paper reviews the procedures we developed to select lasers for deployment in high reliability systems. The problem of screening out short-lived lasers with the aging controlled by low thermal activation energy failure mechanisms is analyzed. The rationale for and development of a purge (a set of laser-specific over-stresses) is described. Reliability results using real time device hours and more than 2 years of field use show that these selection procedures work well.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. L. Hartman, R. L. Hartman, F. R. Nash, F. R. Nash, P. J. Anthony, P. J. Anthony, } "Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers", Proc. SPIE 0616, Optical Technologies for Communication Satellite Applications, (15 May 1986); doi: 10.1117/12.961062; https://doi.org/10.1117/12.961062
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