18 July 1986 Wide Field And Diffraction Limited Array Camera For SIRTF
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Proceedings Volume 0619, Cryogenic Optical Systems and Instruments II; (1986) https://doi.org/10.1117/12.966639
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States
Abstract
The Infrared Array Camera for the Space Infrared Telescope Facility (SIRTF/IRAC) is capable of two-dimensional photometry in either a wide field or diffraction-limited mode over the wavelength interval from 2 to 30 microns. Three different two-dimensional direct readout (DRO) array detectors are being considered: Band 1 - InSb or Si:In (2 - 5 microns) 128 x 128 pixels, Band 2 - Si:Ga (5 - 18 microns) 64 x 64 pixels, and Band 3 - Si:Sb (18 -30 microns) 64 x 64 pixels. The hybrid DRO readout architecture has the advantages of low read noise, random pixel access with individual readout rates, and non-destructive readout. The scientific goals of IRAC are discussed, which are the basis for several important requirements and capabilities of the array camera: 1) diffraction-limited resolution from 2 - 30 microns, 2) use of the maximum unvignetted field of view of SIRTF, 3) simultaneous observations within the three infrared spectral bands, 4) the capability for broad and narrow bandwith spectral resolution. A strategy has been developed to minimize the total electronic and environmental noise sources to satisfy the scientific requirements.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. G. Fazio, G. G. Fazio, D. G. Koch, D. G. Koch, G. J. Melnick, G. J. Melnick, R. M. Tresch-Fienberg, R. M. Tresch-Fienberg, S. P. Willner, S. P. Willner, D. Y. Gezari, D. Y. Gezari, G. Lamb, G. Lamb, P. Shu, P. Shu, G. Chin, G. Chin, R. Silverberg, R. Silverberg, J. Mather, J. Mather, W. F. Hoffmann, W. F. Hoffmann, N. J. Woolf, N. J. Woolf, J. Pipher, J. Pipher, W. Forrest, W. Forrest, C. R. McCreight, C. R. McCreight, } "Wide Field And Diffraction Limited Array Camera For SIRTF", Proc. SPIE 0619, Cryogenic Optical Systems and Instruments II, (18 July 1986); doi: 10.1117/12.966639; https://doi.org/10.1117/12.966639
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