Paper
26 June 1986 Rapid Thermal Growth Of Thin Insulators On Si (Invited)
Mehrdad M. Moslehi, Krishna C. Saraswat, Steven C. Shatas
Author Affiliations +
Abstract
Rapid thermal processing of silicon in oxygen and ammonia reactive ambients has been performed successfully to grow thin layers of Si02, silicon nitride, and silicon nitroxide for high quality gate insulators of submicron CMOS VLSI.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mehrdad M. Moslehi, Krishna C. Saraswat, and Steven C. Shatas "Rapid Thermal Growth Of Thin Insulators On Si (Invited)", Proc. SPIE 0623, Advanced Processing and Characterization of Semiconductors III, (26 June 1986); https://doi.org/10.1117/12.961198
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Cited by 5 scholarly publications.
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KEYWORDS
Silicon

Nitrogen

Interfaces

Temperature metrology

Dielectrics

Oxidation

Semiconducting wafers

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