5 May 1986 Photothermal Deflection Spectroscopy In Zns Electroluminescent Thin Films
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Proceedings Volume 0624, Advances in Display Technology VI; (1986) https://doi.org/10.1117/12.961228
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States
Abstract
Photothermal,deflection spectroscopy is used to determine optical absorption in ZnS:Mn thin film electroluminescent phosphors. The ZnS:Mn sample is immersed in a transparent liquid and optically pumped with a square-wave intensity modulated monochromatic light source. This produces a thermal gradient in the fluid which is probed by a He-Ne laser beam grazing the sample surface. The optical absorption in the sample can be related to the deflection of the laser beam by the thermal lens in the fluid. The relation of the absorption to the energy levels in ZnS:Mn will be discussed.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Barkyoumb, J. Barkyoumb, R. W. Christy, R. W. Christy, "Photothermal Deflection Spectroscopy In Zns Electroluminescent Thin Films", Proc. SPIE 0624, Advances in Display Technology VI, (5 May 1986); doi: 10.1117/12.961228; https://doi.org/10.1117/12.961228
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