Paper
13 October 1986 An Imaging Extreme Ultraviolet Spectrometer For Astrophysical Investigations In Space
M. C.E. Huber, J. G. Timothy, J. S. Morgan, G. Lemartre, G. Tondello, M. E. Puiatti, P. Scarin
Author Affiliations +
Abstract
A high-efficiency, extreme ultraviolet (EUV) imaging spectrometer has been constructed and tested. The spectrometer employs a concave toroidal grating illuminated at normal incidence in a Rowland circle mounting and has only one reflecting surface. The toroidal grating has been fabricated by a new technique employing an elastically deformable submaster grating which is replicated in a spherical form and then mechanically distorted to produce the desired aspect ratio of the toroidal surface for stigmatic imaging over the selected wavelength range. The fixed toroidal grating used in the spectrometer is then replicated from this surface. Photographic tests and initial photo-electric tests with a two-dimensional, pulse-counting detector system have verified the image quality of the toroidal grating at wavelengths near 600 Å. The basic designs of two instruments employing the spectrometer for astrophysical investigations in space are described, namely, a high-resolution EUV spectroheliometer for studies of the solar chromo-phere, transition region, and corona; and an EUV spectroscopic telescope for studies of non-solar objects.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. C.E. Huber, J. G. Timothy, J. S. Morgan, G. Lemartre, G. Tondello, M. E. Puiatti, and P. Scarin "An Imaging Extreme Ultraviolet Spectrometer For Astrophysical Investigations In Space", Proc. SPIE 0627, Instrumentation in Astronomy VI, (13 October 1986); https://doi.org/10.1117/12.968110
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spectroscopy

Extreme ultraviolet

Sensors

Imaging systems

Diffraction gratings

Telescopes

Astronomy

RELATED CONTENT

Robust reflective pupil slicing technology
Proceedings of SPIE (July 18 2014)
Optical design of a CubeSat-compatible imaging spectrometer
Proceedings of SPIE (September 15 2014)
A High Resolution Spectrometer For EUV/FUV Wavelengths
Proceedings of SPIE (October 13 1986)
New MPE near-infrared astronomical imaging spectrometer:3D
Proceedings of SPIE (November 13 1996)
HiRES: the High-Resolution EUV Spectroheliometer
Proceedings of SPIE (October 15 1997)

Back to Top