13 October 1986 EUV Astronomical Spectroscopy With CCD Detectors
Author Affiliations +
Proceedings Volume 0627, Instrumentation in Astronomy VI; (1986); doi: 10.1117/12.968135
Event: 1986 Astronomy Conferences, 1986, Tucson, United States
We discuss the applicability of CCD detectors to astronomical extreme ultraviolet (EUV) spectroscopy ( 100 - 1250 Å). The advantages of CCDs in this spectral region include internal electron yield (~ 3-30 e-/per detected photon), the potential for very high quantum efficiency (~ 50-90 percent ), and broad wavelength response. Visible light suppression is achieved by a combination of low grating scattering, great er than unity electron yield in the EUV, and various filter techniques. For the current generation of (Cl),s detection of only a few EUV photons will rapidly overwhelm the read noise ( < 5-10 e- RMS). Thus for all practical S/N ratios used in ast-ronomical spectroscopy, read noise will be negligible compared to the poisson statistics of the detected photons. We will discuss a model based upon experimental data for the quantum efficiency and electron yield of CCDs in the EUV, outline charge trapping and transport considerations, and describe a program to obtain CCDs with stable EUV/UV quantum efficiency for windowless spaceflight operation.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. A. Stern, R. C. Catura, M. M. Blouke, M. Winzenread, "EUV Astronomical Spectroscopy With CCD Detectors", Proc. SPIE 0627, Instrumentation in Astronomy VI, (13 October 1986); doi: 10.1117/12.968135; https://doi.org/10.1117/12.968135

Charge-coupled devices

Quantum efficiency

Extreme ultraviolet



Ultraviolet radiation



Flash Technology for CCD Imaging in the UV
Proceedings of SPIE (December 10 1986)
Thinned Backside Illuminated CCDs For Ultraviolet Imaging
Proceedings of SPIE (August 16 1988)
CCD's for High Resolution Imaging in the Near and Far...
Proceedings of SPIE (December 10 1986)
Charge-Coupled Device Pinning Technologies
Proceedings of SPIE (May 23 1989)

Back to Top