3 November 1986 Direct Contact Profilometry Of Large Aspherics
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Proceedings Volume 0645, Optical Manufacturing, Testing and Aspheric Optics; (1986) https://doi.org/10.1117/12.964489
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States
Abstract
A commercial coordinate measuring machine has been modified to provide surface profile measurements of one meter optics to an accuracy of 50 microinches. Additional calibration of specific surfaces provides an accuracy of 15 microinches. Data acquisition and analysis software is discussed.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lance D. Lund, Lance D. Lund, } "Direct Contact Profilometry Of Large Aspherics", Proc. SPIE 0645, Optical Manufacturing, Testing and Aspheric Optics, (3 November 1986); doi: 10.1117/12.964489; https://doi.org/10.1117/12.964489
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