Automatic Measurement Of Refractive Index Profile Of Slab Waveguides By Interference Fringe Processing

B. Hillerich; E. Weidel; D. Gruchmann

doi:10.1117/12.938159

3 November 1986 Automatic Measurement Of Refractive Index Profile Of Slab Waveguides By Interference Fringe Processing

B. Hillerich, E. Weidel, D. Gruchmann

Proceedings Volume 0651, Integrated Optical Circuit Engineering III; (1986) https://doi.org/10.1117/12.938159
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Details of index profile measurement of slab waveguides by transverse interferometry using video image processing of the interference fringe pattern are discussed. Resolution limits, data processing and sample preparation are described. Some examples of ion exchanged glass waveguides are given.

Citation Download Citation

B. Hillerich, E. Weidel, and D. Gruchmann "Automatic Measurement Of Refractive Index Profile Of Slab Waveguides By Interference Fringe Processing", Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); https://doi.org/10.1117/12.938159

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