3 November 1986 Optimum Conditions For Waveguide Loss Measurements By Scattered Radiation Detection At Visible And Near-IR Wavelengths
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Proceedings Volume 0651, Integrated Optical Circuit Engineering III; (1986) https://doi.org/10.1117/12.938160
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
An experimental investigation is presented on the conditions affecting the measurement of waveguide loss by detection of scattered radiation. Several factors have been taken into account, including: numerical aperture, magnification, defocusing and spatial resolution of the optical collection system; presence of spurious background; direction of collection and shape of the scattering lobe; mode-selective measurements. Measurements have been made at visible and near-IR wavelengths on planar and stripe waveguides, single- and multi-moded, and results on the best measurement conditions are reported.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. De Bernardi, A. Loffredo, S. Morasca, "Optimum Conditions For Waveguide Loss Measurements By Scattered Radiation Detection At Visible And Near-IR Wavelengths", Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); doi: 10.1117/12.938160; https://doi.org/10.1117/12.938160
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