13 October 1986 On The Determination Of Optical Constants Of Films In Multilayers
Author Affiliations +
Proceedings Volume 0652, Thin Film Technologies II; (1986) https://doi.org/10.1117/12.938380
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
Different strategies are illustrated that can be used with the inverse synthesis method for the determination of the optical constants of coating materials.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J A Dobrowolski, J A Dobrowolski, } "On The Determination Of Optical Constants Of Films In Multilayers", Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); doi: 10.1117/12.938380; https://doi.org/10.1117/12.938380
PROCEEDINGS
3 PAGES


SHARE
RELATED CONTENT

In-Situ Optical Monitoring Of Thin Film Deposition
Proceedings of SPIE (March 10 1989)
High-reflective multilayers as narrowband VUV filters
Proceedings of SPIE (September 01 1991)
Properties of AlF3 and LaF3 films at 193nm
Proceedings of SPIE (October 06 2010)
Exact synthesis of dielectric thin film filters
Proceedings of SPIE (September 29 2004)

Back to Top