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24 September 1986 Determination Of The Characterizing Parameters Of Rough Surfaces For Solar Energy Conversion
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Selective optical properties can be achieved by a suitable surface roughness. Characteristic parameters describing the roughness of the surface profile are the rms-roughness, the rms-slope, and the autocorrelation length. The relation between these parameters and the spectral reflectance of the considered surface is known approximately from the scalar scattering theory. Due to the dimensions of the investigated surface profiles the roughness measurements require scanning electron microscopy for surface imaging. For the statistical evaluation the image data are processed in a computer system, which performs the Fourier-transformation of the whole image. The square of the Fourier transform yields the spectrum of the spatial frequencies from which the autocorrelation function and the correlation length can be derived by inverse Fourier-transformation. The scanning electron microscope causes a systematic imaging error, which can be corrected by approximating the image signal as a superposition of the surface height and its slope. The results are compared with the results of spectral measurements of the specular as well as the hemispherical reflection in the IR-rage applying the scalar theory mentioned above for copper-oxide and chromium absorber coatings.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M Kohl, K Gindele, and M Mast "Determination Of The Characterizing Parameters Of Rough Surfaces For Solar Energy Conversion", Proc. SPIE 0653, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion V, (24 September 1986);

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