Translator Disclaimer
17 November 1986 Real-Time High Accuracy Measurements Utilizing Line-Scan Image Sensors
Author Affiliations +
Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938264
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
Real-time, non-contact, high accuracy measurements of small components are realised utilizing diffraction pattern theory. High speed line-scan CCD (charge coupled device) sensors, coupled with a microcomputer system with specalised hardware, allow the implementation of least squares and transform algorithms for the analysis of diffraction pattern data.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D J Moreland, C A Hobson, M J Lalor, and D B Clegg "Real-Time High Accuracy Measurements Utilizing Line-Scan Image Sensors", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); https://doi.org/10.1117/12.938264
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Super-resolution imaging based on virtual Airy spot
Proceedings of SPIE (March 06 2015)
Log polar image sensor in CMOS technology
Proceedings of SPIE (August 21 1996)
Large-area interline CCD with low-dark current
Proceedings of SPIE (May 16 2003)
High Resolution Linear Arrays
Proceedings of SPIE (May 01 1986)

Back to Top