17 November 1986 The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement
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Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938274
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
Recent developments in digital processing have renewed interest in E.S.P.I., whereby direct contouring is possible with fringes of interferometric quality. It is now possible to locate points on the object accurately in association with E.S.P.I. analysis, although a trade-off between point resolution and fringe visibility seems likely. Nevertheless the time is close for the development of a complete optical inspection system.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B D Bergquist, B D Bergquist, P C Montgomery, P C Montgomery, F Mendoza-Santoyo, F Mendoza-Santoyo, P Henry, P Henry, J Tyrer, J Tyrer, } "The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938274; https://doi.org/10.1117/12.938274
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