17 November 1986 Triangulation With Expanded Range Of Depth
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Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938261
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
We present a scanning triangulation system for large objects with high lateral and longitudinal resolution. The system is based on axicons in the illumination device and on the use of the Scheimpflug-condition in the observation path. We describe a scanning-by-deflection geometry that minimizes the number of necessary detector pixels.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G Hausler, M Maul, "Triangulation With Expanded Range Of Depth", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938261; https://doi.org/10.1117/12.938261
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