Automated Characterization Of Infrared Systems Spatial Resolution

P E Thurlow

doi:10.1117/12.938413

31 October 1986 Automated Characterization Of Infrared Systems Spatial Resolution

P E Thurlow

Proceedings Volume 0655, Optical System Design, Analysis, Production for Advanced Technology Systems; (1986) https://doi.org/10.1117/12.938413
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

An automated technique has been developed for predicting square wave response of infrared optical systems. The method avoids conventional physical measurements of square wave modulation employing bar reticle images. As a result, the method can be applied to theoretical (modeled) infrared optics as well as real optical systems, and can thus be used as a standard tool for resolution evaluation during all phases of system development and production.

Citation Download Citation

P E Thurlow "Automated Characterization Of Infrared Systems Spatial Resolution", Proc. SPIE 0655, Optical System Design, Analysis, Production for Advanced Technology Systems, (31 October 1986); https://doi.org/10.1117/12.938413

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