31 October 1986 Automated Characterization Of Infrared Systems Spatial Resolution
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Abstract
An automated technique has been developed for predicting square wave response of infrared optical systems. The method avoids conventional physical measurements of square wave modulation employing bar reticle images. As a result, the method can be applied to theoretical (modeled) infrared optics as well as real optical systems, and can thus be used as a standard tool for resolution evaluation during all phases of system development and production.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P E Thurlow, P E Thurlow, } "Automated Characterization Of Infrared Systems Spatial Resolution", Proc. SPIE 0655, Optical System Design, Analysis, Production for Advanced Technology Systems, (31 October 1986); doi: 10.1117/12.938413; https://doi.org/10.1117/12.938413
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