25 November 1986 Design And Characterization Of Graded Reflectivity Mirrors
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Proceedings Volume 0661, Optical Testing and Metrology; (1986) https://doi.org/10.1117/12.938639
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada
A new design of graded reflectivity mirrors is presented. It consists in depositing an appropriately shaped thin layer of a high-refractive-index dielectric on a transparent substrate. The technique used to deposit the profiled layer is discussed. Mirrors with Gaussian reflectivity profiles have been fabricated for use at 10.6 and 3.7 μm. An interferometer which has been setup to characterize the distortions of the reflected and transmitted wave fronts of one of the 10-μm prototypes is described and the results are presented.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathalie McCarthy, Nathalie McCarthy, Pierre Lavigne, Pierre Lavigne, J.-G. Demers, J.-G. Demers, Andre Parent, Andre Parent, } "Design And Characterization Of Graded Reflectivity Mirrors", Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938639; https://doi.org/10.1117/12.938639

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