Paper
25 November 1986 Optical Metrology In Length And Mechanical Standards
G. D. Chapman
Author Affiliations +
Proceedings Volume 0661, Optical Testing and Metrology; (1986) https://doi.org/10.1117/12.938620
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada
Abstract
A review is presented of the introduction and development of optical techniques and devices in the broad area of metrology in length and mechanical standards. Emphasis is placed upon those techniques which have been made possible by the use of lasers, or which have substantially increased accuracy and reduced work loads on a routine basis. In particular, the use of optical fourier transform techniques in metrology applied to disciplines as diverse as standards, engineering, plasma physics, and biology are explored.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. D. Chapman "Optical Metrology In Length And Mechanical Standards", Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); https://doi.org/10.1117/12.938620
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Fourier transforms

Interferometers

Photomicroscopy

Metrology

Axons

Beam splitters

Optical testing

RELATED CONTENT

Status of multi-beam long trace-profiler development
Proceedings of SPIE (September 27 2013)
Gaussian beam modeling of the radius of curvature
Proceedings of SPIE (August 18 2005)
Rules for optical metrology
Proceedings of SPIE (October 25 2011)

Back to Top