25 November 1986 Photometric Ordering Of Ordinary Moire Fringes
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Proceedings Volume 0661, Optical Testing and Metrology; (1986) https://doi.org/10.1117/12.938596
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada
Abstract
A method is described for ordering the fringes in ordinary moire topograms that resolves hill-or-valley ambiguities. A photometric model is used to predict the expected surface brightness for the up and down surface orientation possibilities. Only one of the orientations produces estimates that are consistent with the measured values. The photometric model is based globally upon the moire geometry, and locally upon the surface reflectance properties. Topograms of test objects and human subjects are presented to illustrate the principle of photometric ordering.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James R. Pekelsky, James R. Pekelsky, Ding Xinhong, Ding Xinhong, } "Photometric Ordering Of Ordinary Moire Fringes", Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938596; https://doi.org/10.1117/12.938596
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