Laser Mike Optical Micrometers: In Theory And In Use

John Godshall; Harry Petrohilos

doi:10.1117/12.938810

23 October 1986 Laser Mike Optical Micrometers: In Theory And In Use

John Godshall, Harry Petrohilos

Proceedings Volume 0665, Optical Techniques for Industrial Inspection; (1986) https://doi.org/10.1117/12.938810
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada

Abstract

The LaserMike optical micrometer system uses a scanning helium-neon laser to perform non-contact gauging of profile dimensions. High-speed, accurate gauging of stationary or moving products is possible. By combination with microprocessor-based controllers, the LaserMike can be effectively utilized in a variety of integrated automatic systems.

Citation Download Citation

John Godshall and Harry Petrohilos "Laser Mike Optical Micrometers: In Theory And In Use", Proc. SPIE 0665, Optical Techniques for Industrial Inspection, (23 October 1986); https://doi.org/10.1117/12.938810

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available