Far Infrared Spectroscopy Of Hg1-xCdxTe And Related Materials

S Perkowitz

doi:10.1117/12.938826

26 September 1986 Far Infrared Spectroscopy Of Hg1-xCdxTe And Related Materials

S Perkowitz

Proceedings Volume 0666, Far-Infrared Science and Technology; (1986) https://doi.org/10.1117/12.938826
Event: 1986 Quebec Symposium, 1986, Quebec City, Canada

Abstract

Far infrared measurements between 10 and 250 cm^-1 characterize and probe II-VI semiconductor systems of current scientific and technical interest including: the leading infrared detector material Hg_1-xCd_xTe; the substrate materials CdTe and Cd_1-xZn_xTe; the magnetic semiconductor Hg_l-xMnxTe; and the new HgTe-CdTe superlattice. The advantages, the theory and the technique of these measurements are reviewed and applications to these materials are described.

Citation Download Citation

S Perkowitz "Far Infrared Spectroscopy Of Hg1-xCdxTe And Related Materials", Proc. SPIE 0666, Far-Infrared Science and Technology, (26 September 1986); https://doi.org/10.1117/12.938826

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