Paper
10 November 1986 The Fiber-Optic Instrument For Extremely Small Roughness Measurement
A. Domanski, W. Ejchart, J. Jedrzejewski, R. M. Siegoczynski, W. Tlaczala
Author Affiliations +
Proceedings Volume 0670, Optical Fibres and Their Applications IV; (1986) https://doi.org/10.1117/12.938978
Event: Optical Fibres and Their Applications, 1986, Warsaw, Poland
Abstract
The fiber-optic instrument of ability to measure roughness of surfaces has been built. It works in the range of profil mean deviation 20 nm <Ra <150 nm. Light of 0,88 μm wave length is led by the fiber to the surface and is analysed by other fiber fixed in a focal plane of the lens. The device is used to check the base plate in microelectronic semi-conductor technics.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Domanski, W. Ejchart, J. Jedrzejewski, R. M. Siegoczynski, and W. Tlaczala "The Fiber-Optic Instrument For Extremely Small Roughness Measurement", Proc. SPIE 0670, Optical Fibres and Their Applications IV, (10 November 1986); https://doi.org/10.1117/12.938978
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Radium

Receivers

Light scattering

Fiber optics

Sensors

Optical fibers

Fiber optics tests

Back to Top